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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Электронный ресурс Process-Aware SRAM Design and Test / by Andrei Pavlov, Manoj Sachdev.
Material type: Computer fileSeries: Frontiers In Electronic TestingPublication details: Dordrecht : Springer Science + Business Media B.V, 2008ISBN: 9781402083631Subject(s): engineering | Memory management (Computer science) | Systems engineering | Engineering | Circuits and Systems | Memory StructuresOnline resources: Click here to access online In: Springer eBooksNo physical items for this record
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