| 000 | 02364nab a2200337 c 4500 | ||
|---|---|---|---|
| 001 | vtls000672394 | ||
| 003 | RU-ToGU | ||
| 005 | 20210922103536.0 | ||
| 007 | cr | | ||
| 008 | 191219|2019 ru s a eng d | ||
| 024 | 7 |
_a10.17223/19988605/49/11 _2doi |
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| 035 | _ato000672394 | ||
| 040 |
_aRU-ToGU _brus _cRU-ToGU |
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| 100 | 1 |
_aChetvertakova, Evgeniia Sergeevna _9499197 |
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| 245 | 1 | 0 |
_aTesting significance of random effects for the gamma degradation model _cE. S. Chetvertakova, E. V. Chimitova |
| 246 | 1 | 1 | _aПроверка значимости случайного эффекта для деградационной гамма-модели |
| 504 | _aБиблиогр.: 11 назв. | ||
| 520 | 3 | _aGamma degradation models with fixed or random effects are widely used for reliability analysis. In this paper, the problem of testing significance of random effects for the gamma degradation model is considered. We propose two statistical tests which enable to reveal the existence of random effects in degradation data corresponding to the gamma degradation model. The first test is the well known likelihood ratio test and the second one is based on the variance estimate of the random parameter of the “random-effect” gamma degradation model. These tests have been compared in terms of power with Monte-Carlo simulation method. Moreover, the example of GaAs lasers degradation analysis has been considered. | |
| 653 | _aдеградационная гамма-модель | ||
| 653 | _aмодель с фиксированным эффектом | ||
| 653 | _aмодель со случайным эффектом | ||
| 653 | _aнадежность | ||
| 653 | _aарсенид-галлиевые лазеры | ||
| 655 | 4 |
_aстатьи в журналах _9745982 |
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| 700 | 1 |
_aChimitova, Ekaterina Vladimirovna _9499198 |
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| 773 | 0 |
_tВестник Томского государственного университета. Управление, вычислительная техника и информатика _d2019 _g№ 49. С. 92-100 _x1998-8605 _w0210-40860 |
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| 852 | 4 | _aRU-ToGU | |
| 856 | 4 | _uhttp://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000672394 | |
| 908 | _aстатья | ||
| 999 | _c461310 | ||