000 01938nab a2200325 c 4500
001 vtls000644986
003 RU-ToGU
005 20230303172111.0
007 cr |
008 181203|2017 ne s a eng dd
024 7 _a10.1016/j.jnoncrysol.2017.07.014
_2doi
035 _ato000644986
040 _aRU-ToGU
_brus
_cRU-ToGU
245 1 0 _aIsothermal and CW laser crystallization of amorphous Ge2Sb2Te5 thin films
_cS. A. Kozyukhin, Y. Vorobyov, P. I. Lazarenko, M. Presniakov
504 _aБиблиогр.: 42 назв.
520 3 _aTransmission electron microscopy results are presented for as-deposited amorphous Ge2Sb2Te5 thin films after theirs isothermal annealing and CW laser illumination. Obtained microphotographs suggested that the crystallization process was driven solely by heterogeneous nucleation on the film boundary. The simplified model of steady-state crystallization process was developed for the case of heterogeneous nucleation mechanism. The values of nucleation rate and growth rate for isothermal and CW laser crystallization are calculated. The calculated values are in reasonable agreement with both our experimental data and with results previously published by the other authors.
653 _aтонкие пленки
653 _aизотермический отжиг
653 _aкристаллизация
655 4 _aстатьи в журналах
_9745982
700 1 _aVorobyov, Yuri
_9488475
700 1 _aLazarenko, Petr I.
_9481682
700 1 _aPresniakov, Michael
_9475151
700 1 _aKozyukhin, Sergey A.
_9437926
773 0 _tJournal of non-crystalline solids
_d2017
_gVol. 480. P. 51-56
_x0022-3093
852 4 _aRU-ToGU
856 7 _uhttp://vital.lib.tsu.ru/vital/access/manager/Repository/vtls:000644986
908 _aстатья
999 _c443787