000 01449nmm a22003495u 4500
001 vtls000355575
003 RU-ToGU
005 20210922023331.0
007 cr nn 008mamaa
008 120828s2007 xx j eng d
020 _a9781402051883
035 _ato000355575
040 _aSpringer
_cSpringer
_dRU-ToGU
100 1 _aChiang, Charles C.
_9313922
245 1 0 _aDesign for Manufacturability and Yield for Nano-Scale CMOS
_hЭлектронный ресурс
_cby Charles C. Chiang, Jamil Kawa.
260 _aDordrecht :
_bSpringer,
_c2007.
490 1 0 _aSeries on Integrated Circuits and Systems,
_x1558-9412
650 0 _aComputer aided design
_9303150
650 0 _aComputer engineering
_9303142
650 0 _aSystems engineering
_9303074
650 1 4 _aComputer Science
_9155490
650 2 4 _aCircuits and Systems
_9303075
650 2 4 _aComputer-Aided Engineering (CAD, CAE) and Design
_9303153
650 2 4 _aElectronic and Computer Engineering
_9303147
700 1 _aKawa, Jamil.
_9313923
710 2 _aSpringerLink (Online service)
_9143950
773 0 _tSpringer e-books
830 _aSeries on Integrated Circuits and Systems,
_9303156
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4020-5188-3
999 _c232339