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Laboratory Micro-X-Ray Fluorescence Spectroscopy electronic resource Instrumentation and Applications / by Michael Haschke.

By: Haschke, Michael [author.]Contributor(s): SpringerLink (Online service)Material type: TextTextSeries: Springer Series in Surface SciencesPublication details: Cham : Springer International Publishing : Imprint: Springer, 2014Description: XVIII, 356 p. 254 illus., 107 illus. in color. online resourceContent type: text Media type: computer Carrier type: online resourceISBN: 9783319048642Subject(s): physics | Spectroscopy | Surfaces (Physics) | Physics | Spectroscopy and Microscopy | Surfaces and Interfaces, Thin Films | Measurement Science and Instrumentation | Spectroscopy/Spectrometry | Surface and Interface Science, Thin FilmsDDC classification: 621.36 LOC classification: QC450-467QC718.5.S6Online resources: Click here to access online
Contents:
XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications.
In: Springer eBooksSummary: Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.
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XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications.

Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

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