Normal view
MARC view
Software Process and Product Measurement Электронный ресурс International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings / edited by David Hutchison, Takeo Kanade, Josef Kittler, Jon M. Kleinberg, Friedemann Mattern, John C. Mitchell, Moni Naor, Oscar Nierstrasz, C. Pandu Rangan, Bernhard Steffen, Madhu Sudan, Demetri Terzopoulos, Doug Tygar, Moshe Y. Vardi, Gerhard Weikum, Reiner R. Dumke, René Braungarten, Günter Büren, Alain Abran, Juan J. Cuadrado-Gallego.
Material type: Computer fileSeries: Lecture Notes in Computer SciencePublication details: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008ISBN: 9783540894032Subject(s): education | Information systems | Information systems | Software engineering | Computer Science | Computer Appl. in Administrative Data Processing | Computers and Education | Management of Computing and Information Systems | Software EngineeringOnline resources: Click here to access online In: Springer eBooksNo physical items for this record
There are no comments on this title.
Log in to your account to post a comment.