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	1.	No cover image available On the fault coverage of high-level test derivation methods for digital circuits J. López, E. Vinarsky, A. Laputenko by López, Jorge \| Vinarskii, Evgenii \| Laputenko, Andrey V. Material type: Article; Format: electronic available online ; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	2.	No cover image available Testing microcontroller based physical systems using finite transition models L. A. Laputenko, T. D. Petukhov, N. A. Vasnev by Laputenko, Andrey V \| Petukhov, Timofey D \| Vasnev, Nikolai A. Source: 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2018), Erlagol, Altai Republic, 29 June - 3 July, 2018 : proceedingsMaterial type: Article; Format: electronic available online ; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	3.	No cover image available Optimizing components of finite state machines composition based on don’t care input sequences in hardware implementation E. Shirokova, L. Evtushenko, A. V. Laputenko by Shirokova, Ekaterina \| Evtushenko, Larisa \| Laputenko, Andrey V. Source: 2021 IEEE East-West Design & Test Symposium (EWDTS), Batumi, Georgia, September 10-13, 2021 : proceedingsMaterial type: Article; Format: electronic available online ; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	4.	No cover image available Assessing trustworthiness of IoT applications using logic circuits A. V. Laputenko by Laputenko, Andrey V. Source: 2021 IEEE East-West Design & Test Symposium (EWDTS), Batumi, Georgia, September 10-13, 2021 : proceedingsMaterial type: Article; Format: electronic available online ; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)
	5.	No cover image available Testing digital circuits: studying the increment of the number of states and estimating the fault coverage E. Vinarskii, A. Laputenko, J. López, N. G. Kushik by Laputenko, Andrey V \| López, Jorge \| Kushik, Natalia G \| Vinarskii, Evgenii. Source: 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM 2018), Erlagol, Altai Republic, 29 June - 3 July, 2018 : proceedingsMaterial type: Article; Format: electronic available online ; Literary form: Not fiction ; Audience: Specialized; Online access: Click here to access online Availability: No items available : Log in to add tags Add to cart (remove)