TY  - BOOK
AU  - Haschke,Michael
ED  - SpringerLink (Online service)
TI  - Laboratory Micro-X-Ray Fluorescence Spectroscopy: Instrumentation and Applications 
T2  - Springer Series in Surface Sciences,
SN  - 9783319048642
AV  - QC450-467 
U1  - 621.36 23
PY  - 2014///
CY  - Cham
PB  - Springer International Publishing, Imprint: Springer
KW  - physics
KW  - Spectroscopy
KW  - Surfaces (Physics)
KW  - Physics
KW  - Spectroscopy and Microscopy
KW  - Surfaces and Interfaces, Thin Films
KW  - Measurement Science and Instrumentation
KW  - Spectroscopy/Spectrometry
KW  - Surface and Interface Science, Thin Films
N1  - XRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications
N2  - Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions
UR  - http://dx.doi.org/10.1007/978-3-319-04864-2
ER  -