TY  - DATA
AU  - Pavlov,Andrei
AU  - Sachdev,Manoj
ED  - SpringerLink (Online service)
TI  - CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test 
T2  - Frontiers In Electronic Testing,
SN  - 9781402083631
PY  - 2008///
CY  - Dordrecht
PB  - Springer Science + Business Media B.V
KW  - engineering
KW  - Memory management (Computer science)
KW  - Systems engineering
KW  - Engineering
KW  - Circuits and Systems
KW  - Memory Structures
UR  - http://dx.doi.org/10.1007/978-1-4020-8363-1
ER  -