TY  - DATA
AU  - Larsson,Erik
ED  - SpringerLink (Online service)
TI  - Introduction to Advanced System-on-Chip Test Design and Optimization
T2  - Frontiers in Electronic Testing,
SN  - 9780387256245
PY  - 2005///
CY  - Boston, MA
PB  - Springer
KW  - Computer engineering
KW  - electronics
KW  - engineering
KW  - Engineering design
KW  - Optical materials
KW  - Engineering
KW  - Electronic and Computer Engineering
KW  - Electronics and Microelectronics, Instrumentation
KW  - Engineering Design
KW  - Optical and Electronic Materials
UR  - http://dx.doi.org/10.1007/b135763
ER  -