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ROBDD based path delay fault testable combinational circuit synthesis T. Shah, V. Singh, A. Matrosova
Material type: ArticleSubject(s): ROBDD-графы | последовательностные схемыGenre/Form: статьи в сборниках Online resources: Click here to access online In: Proceedings of IEEE East-West Design & Test Symposium (EWDTS'2016), Yerevan, Armenia, October 14-17, 2016 P. 181-184No physical items for this record
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