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Increasing Manufacturing Yield Using Partially Programmable Circuits with CLB implementation of Incompletely Specified Boolean Function of the Corresponding Sub-circuit A. Y. Matrosova, S. A. Ostanin, I. E. Kirienko
Material type: ArticleSubject(s): константные неисправности | проверяющие тесты | булевы функции | конфигурируемые логические блоки | частично программируемые схемыGenre/Form: статьи в сборниках Online resources: Click here to access online In: Proceedings 2015 IEEE : 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2015), 22-24 April 2015, Belgrade, Serbia P. 267-270No physical items for this record
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