Normal view
MARC view
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching application to rough and natural surfaces G. Kaupp
Material type:
TextSeries: NanoScience and technologyPublication details: Heidelberg Springer 2006Description: XII, 292 p. illISBN: 9783540284055; 3540284052ISSN: 1434-4904Subject(s): оптическая микроскопия | наноиндентирование | атомно-силовая микроскопия
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
| Выдается в читальный зал | Научная библиотека ТГУ Книгохранилище | 1-974532к (Browse shelf(Opens below)) | Available | 13820000672984 |
Browsing Научная библиотека ТГУ shelves, Shelving location: Книгохранилище Close shelf browser (Hides shelf browser)
Includes bibliographical references
Index: p. 279-292
There are no comments on this title.
Log in to your account to post a comment.